Estudo de filmes ultra-finos de Sb/In crescidos sobre Ni (111)

AUTOR(ES)
DATA DE PUBLICAÇÃO

2005

RESUMO

In this thesis we present a studied the growth of the ultra-thin films of Sb on Ni(111) and In on Ni(111), in the sub-monolayer regime. The main interest was on the understanding of the crystallography and electronic structure theses surface alloys. The films were grown under UHV conditions and characterized as to their electronic structure by X-ray Photoelectron Spectroscopy (XPS) and simulated theoretically by density functional theory (DFT). To determine the crystallography structure, LEED and photoelectron diffraction (PED) was used. The Sb on Ni(111) films after annealing stabilized as a substitution surface alloy in the ( Ö 3 x Ö 3 ) R 30 ° structure following the fcc substrate. The In on Ni(111) films formed two ordered phases 2x2 and (Ö 3 x Ö 3) R30 ° coexisting on the surface, both the phases formed substitution alloys following the fcc substrate. The electronic structure of both the films didn?t show evidence of charge transfer between the atoms, but of a possible charge redistribution between the states of the Ni atoms in contact with the evaporated film.

ASSUNTO(S)

nickel fotoeletrons - difração niquel photoelectronics - difraction raios x - difração filmes ultra-finos x-rays - diffraction ultra-thin films

ACESSO AO ARTIGO

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