Semiconductor Device Noise
Mostrando 1-3 de 3 artigos, teses e dissertações.
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1. Modeling of statistical low-frequency noise of deep-submicrometer MOSFETs
The low—frequency noise (LF-noise) of deep-submicrometer MOSFETs is experimentally studied with special emphasis on yield relevant parameter scattering. A novel modeling approach is developed which includes detailed consideration of statistical effects. The model is based on device physics parameters which cause statistical variations in LF-noise behavior
Publicado em: 2011
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2. Processamento de sinais e reconhecimento de padrões de resposta de sensores de gases através da geometria fractal. / Signal processing and pattern recognition of gas sensors response by fractal geometry.
The aim of the present work was to propose methods for signal possessing and pattern, recognition from the signals response of gas sensors using models and techniques from the fractal geometry. The data studied and analyzed were obtained from two kinds of sensors. The first sensor was the tin oxide device, which detection principle is based on the resistivit
Publicado em: 2007
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3. Filmes finos de iodeto de chumbo como detector de raios-X para imagens médicas / Lead Iodide Thin Films as X-ray detectors for Medical Imaging
In the last few years, great interest has been focused to high atomic number and wide band gap semiconductor materials for applications in room temperature ionizing radiation detection using the direct detection method. Some materials such as PbI2, HgI2, TlBr, CdTe and CdZnTe are good photoconductors and can be used at room temperature. As a good candidate,
Publicado em: 2007