Crescimento, estrutura e magnetismo de filmes ultrafinos de Ni depositados sobre Pd(100)

AUTOR(ES)
FONTE

IBICT - Instituto Brasileiro de Informação em Ciência e Tecnologia

DATA DE PUBLICAÇÃO

27/02/2012

RESUMO

In this work, the growth mode, the structure and the magnetic behavior of ultrathin Ni films epitaxially grown over Pd(100) were investigated using in-situ experimental techniques ass RHEED, LEED, AES, MBE and MOKE, and ex-situ VSM. The objective was to study the influence of the stress induced by the lattice parameter mismatch of the materials (10,4%), the influence of temperature and the presence of a capping layer. We found a layer by layer growth mode up to a thickness of ~4 ML, followed by the growth in islands. The film presented a TFC tetragonal structure up to 11 ML, then suffers a transition indicated by a strong elevation on the coercivity and by the proximity of the interplanar distance ass compared to bulk Ni. The film structure returns to it`s original CFC bulk configuration above ~15 ML. The magnetic hysteresis curves, obtained from 4,6 ML, presented a squared shape indicating that the easy axis stood in the film plane for the thickness (4,6 to 18,3 ML) and temperature (150 to 350 K) ranges investigated. The coercive field value grows with the presence of a capping layer and as the temperature goes down. There was no indication of a spin reorientation transition or perpendicular magnetic anisotropy.

ASSUNTO(S)

filmes finos propriedades magnéticas fisica da materia condensada thin films magnetic properties

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