Characterization of cadmium and zinc telluride (CZT) and pin type silicon (Si-Pin) photodiode detectors for x-ray spectrometry / Characterization of cadmium and zinc telluride (CZT) and pin type silicon (Si-Pin) photodiode detectors for x-ray spectrometry / CaracterizaÃÃo dos detectores de telureto de cÃdmio e zinco (CZT) e fotodiodo de silÃcio tipo pin (Si-PIN) para a espectrometria de raios-x / CaracterizaÃÃo dos detectores de telureto de cÃdmio e zinco (CZT) e fotodiodo de silÃcio tipo pin (Si-PIN) para a espectrometria de raios-x
AUTOR(ES)
Antonio Jorge Oliveira de Carvalho
DATA DE PUBLICAÇÃO
2008
RESUMO
A detailed understanding of X-ray spectrum is essential for analyzing equipment that emits this kind of radiation in radiodiagnostic facilities. Information on the various parameters that are contained in this spectrum is important for quality control of X-ray equipment. Spectrometry of X-ray beams uses very often GeHP detectors, that have good detection efficiency and high resolution. However they need to be cooled with liquid nitrogen, which makes mobility difficult and becomes expensive for various applications. In this study, Cd0,9Zn0,1Te (CZT) e Si-PIN thermoelectrically refrigerated detectors were used for the construction of a spectrometry system. The response of the detectors to monoenergetic photons was investigated with and X-rays emitted by calibrated sources of Am241, Ba133, Cd109 e Co57. Also continuous X-rays spectra were obtained from an industrial X-ray irradiation tube for high voltages in the range of 40 kV to 120 kV, with and without the use of filters. The spectrum distortions due to primary X-ray from the crystal were corrected for efficiency detection by means of GEANT4 Monte Carlo code. The corrected X-ray spectra presented a good agreement with the spectra of the reference catalogue. The results indicated that the CZT and Si-PIN detectors have a performance that is compatible with the GeHP detectors and therefore, are adequate for diagnostic X-ray spectrometry and X-ray fluorescence, respectively, considering that the appropriate corrections is applied
ASSUNTO(S)
detector de si-pin engenharia nuclear detector de czt diagnostic x-ray spectrometry czt detectors espectrometria de raios-x diagnÃstico si-pin detectors
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