ToF-SIMS Characterization of Nanostructured ZrO2 Coatings Applied to Near Equiatomic Ni-Ti Alloy

The ToF-SIMS technique was applied to analyze thin ZrO2 coatings deposited on the surface of a Ni-Ti alloy. Due to its nanostructured nature, these films are difficult to characterize by conventional techniques. ZrO2 coatings were deposited on near equiatomic Ni-Ti wires by pulse electrodeposition. Part of the samples was electrolytically polished before the coating process. The coated samples were then analyzed by ToF-SIMS to evaluate the influence of the deposition time and previous surface electropolishing on the structure of the deposited coating. The results indicate that thicker coatings...