Microscopic aspects of the colonization of Pyricularia oryzae on the rachis of wheat plants supplied with silicon

Considering the importance of blast, caused by Pyricularia oryzae, to reduce wheat yield, this study investigate how silicon (Si) could reduce the wheat blast symptoms in the rachis tissues using light microscopy and scanning electron microscopy. Wheat plants (cv. BR 18) were grown in hydroponic culture with either 0 (–Si) or 2 mM (+Si) of Si. Blast symptoms were very well developed on the spikes of the –Si plants, which showed intense discoloration in contrast with the spikes of the +Si plants. At 72 hours after inoculation (hai), fungal hyphae extensively colonized the epidermis and the ...