Silicon Cantilever
Mostrando 1-8 de 8 artigos, teses e dissertações.
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1. Mechanical Loss Angle Measurement for Stressed thin Film Using Cantilever Ring-Down Method
Mechanical loss of the coating materials, and hence thermal noise from the mirror coatings, is a limiting factor for the sensitivity of the laser interferometer gravitational waves detector at its most sensitive frequency range. Mechanical loss of the thin films are often measured using the cantilever ring-down method. But when the thin film is under stress,
Mat. Res.. Publicado em: 28/05/2018
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2. Evaluation of piezoresistivity properties of sputtered ZnO thin films
Zinc oxide (ZnO) thin films were deposited by RF reactive magnetron sputtering on silicon (100) substrates under different experimental conditions. ZnO films were studied before and after annealing treatment at 600 °C. The crystallinity, electrical resistivity, stoichiometry, thickness, and elastic modulus of the films were investigated. ZnO piezoresistors
Mat. Res.. Publicado em: 03/06/2014
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3. Magnetostricção e Anisotropia Magnética de filmes de Cobalto em substratos de vidro e silício / Magnetostricção and magnetic anisotropy of cobalt films on glass substrates and silicon
Este trabalho tem como objetivo estudar a magnetostricção e a anisotropia magnética de filmes finos de cobalto usando a técnica de Ressonância Ferromagnética. As amostras investigadas foram produzidas pela técnica de magnetron sputtering, depositadas sobre substratos de vidro e silício, com espessuras variando na faixa de 10 a 20 nm. Os valores efeti
IBICT - Instituto Brasileiro de Informação em Ciência e Tecnologia. Publicado em: 09/09/2011
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4. Magnetostricção e Anisotropia Magnética de filmes de Cobalto em substratos de vidro e silício / Magnetostricção and magnetic anisotropy of cobalt films on glass substrates and silicon
Este trabalho tem como objetivo estudar a magnetostricção e a anisotropia magnética de filmes finos de cobalto usando a técnica de Ressonância Ferromagnética. As amostras investigadas foram produzidas pela técnica de magnetron sputtering, depositadas sobre substratos de vidro e silício, com espessuras variando na faixa de 10 a 20 nm. Os valores efeti
Publicado em: 2011
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5. Análise do potencial de calibração da força óptica através de dispositivos de microscopia de força atômica / Analysis of the calibration potential of optical force through atomic force microscopy devices
O microscópio de força atômica é uma ferramenta que possibilita a medida de forças precisamente localizadas com resoluções no tempo, espaço e força jamais vistas. No coração deste instrumento está um sensor a base de uma viga (cantilever) que é responsável pelas características fundamentais do AFM. O objetivo desta pesquisa foi usar a deflexã
IBICT - Instituto Brasileiro de Informação em Ciência e Tecnologia. Publicado em: 19/12/2005
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6. Multiple label-free biodetection and quantitative DNA-binding assays on a nanomechanical cantilever array
We report a microarray of cantilevers to detect multiple unlabeled biomolecules simultaneously at nanomolar concentrations within minutes. Ligand-receptor binding interactions such as DNA hybridization or protein recognition occurring on microfabricated silicon cantilevers generate nanomechanical bending, which is detected optically in situ. Differential mea
The National Academy of Sciences.
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7. Viscoelasticity of living cells allows high resolution imaging by tapping mode atomic force microscopy.
Application of atomic force microscopy (AFM) to biological objects and processes under physiological conditions has been hampered so far by the deformation and destruction of the soft biological materials invoked. Here we describe a new mode of operation in which the standard V-shaped silicon nitride cantilever is oscillated under liquid and damped by the in
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8. Carbon nanotube atomic force microscopy tips: Direct growth by chemical vapor deposition and application to high-resolution imaging
Carbon nanotubes are potentially ideal atomic force microscopy probes because they can have diameters as small as one nanometer, have robust mechanical properties, and can be specifically functionalized with chemical and biological probes at the tip ends. This communication describes methods for the direct growth of carbon nanotube tips by chemical vapor dep
The National Academy of Sciences.