Study of the Doppler broadening of positron annihilation radiation in silicon
AUTOR(ES)
Nascimento, E. do, Helene, O., Vanin, V. R., Moralles, M.
FONTE
Brazilian Journal of Physics
DATA DE PUBLICAÇÃO
2005-09
RESUMO
We report the measurement of Doppler broadening annihilation radiation in silicon, using 22Na as a positron source, and two Ge detectors arrangement. The two-dimensional coincidence energy spectrum was fitted using a model function. The model function included at rest positron annihilation with valence band, 2p, 2s, and 1s electrons. In-flight positron annihilation was also fitted. The detectors response functions included backscattering, and a combination of Compton effects, pileup, ballistic deficit, and pulse shaping problems. The obtained results agree well with the literature.
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