Study of DNA films by the CD, X-ray and polarization microscopy techniques.

AUTOR(ES)

Potaman, V N

RESUMO

DNA films with psi +/- CD spectra have been investigated. X-ray analysis has shown the sign of the psi spectra to be independent of the secondary structure of DNA. The appearance of the psi spectra is attended by the formation of a characteristic polygonal texture of the cholesteric type in the DNA film.

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