Spectral domain analysis of double screen frequency selective surfaces

AUTOR(ES)

Campos, Antonio Luiz Pereira de Siqueira, Silva, Tércio de Lima

FONTE

Journal of Microwaves, Optoelectronics and Electromagnetic Applications

DATA DE PUBLICAÇÃO

2012-06

RESUMO

This paper presents a numerical investigation for a double screen frequency selective surface (FSS) with perfectly conducting rectangular patch elements. The analysis uses a full wave technique to obtain the scattering characteristics. The analysis combines the immitance approach and the method of moments to obtain the scattered fields and, consequently, the scattering characteristics of the structure. For validation of the analysis, numerical results are compared with measured and numerical results presented by another authors. A good agreement was obtained with experimental results.

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