Modeling discrete heterogeneity in X-ray diffraction data by fitting multi-conformers

AUTOR(ES)

van den Bedem, Henry

FONTE

International Union of Crystallography

RESUMO

A new algorithm that automatically models discrete heterogeneity in X-ray data demonstrates that the variability observed at high resolution can be adequately represented by including correlated structural features in protein models. The algorithm is based on simultaneous exploration of a very large number of alternative interpretations of electron-density maps.

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