Luminescence dosimeter based on magnesium doped aluminum oxide: production and characterization. / Confecção e caracterização de dosímetro luminescente de óxido de alumínio dopado com magnésio.

AUTOR(ES)
DATA DE PUBLICAÇÃO

2008

RESUMO

The aim of the present work is to obtain and characterize luminescent dosimeters made of magnesium doped aluminium oxide, for ionizing radiation dosimetry purposes. The material is produced by Pechini Method (US Patent 3.330.697, 1967), starting from a polymer that generates powder ceramic, after firing at predetermined temperatures. Dosimetric measurements were taken during heating cycles (Thermoluminescence) with gamma and X-rays irradiated samples. Due to physical properties of the crystal, light is emitted during heating, because of free carriers being released from trap centers and recombining with opposite sigh charges. Chemical analysis indicated the Mg2+ concentrations 0.47, 0.88, 1.32, 2.61 and 3.36 mol%; reactants masses and process parameters were adequate to obtain uniformity. From X-Ray Diffraction, samples calcinated at lower temperatures did not reach the properly structural phase. The gamma phase did not show dosimetric properties for the preferred spectra (UV/visible region). Calcinations at higher temperatures were necessary to obtain alpha phase, which exhibited TL emission. For doped sample, diffractograms indicated the occurrence of highly crystalline sample. TL glow curves showed high visible and UV emission, with peaks at 125, 200, 280, 365 and above 450°C. The lowest peak was faded within 24 hours after irradiation and those above 280°C could not be exactly determined due to peak overlapping. Nevertheless, the emission peak at 200°C showed itself a great achievement for the present work, because of its energy depth and dose response. For higher absorbed doses (above 100 Gy), the emission generated by deeper traps could be studied with more details: acceptable TL response and exponential growth were exhibited. The peak at 280 was not reported. Low energy dependence luminescence in observed for doses as high as 40 keV. This limitation is due to decreasing of photoelectric phenomena, which is responsible for charges trapping. Images obtained using Transmission Electron Microscopy detected surface layer in doped samples; such layer is composed by spinel (MgAl2O4). The presence of spinel layer increases recombination centers concentration, once luminescence enhancement was perceived for doped samples.

ASSUNTO(S)

dosimetria termoluminescente alumina thermoluminescence dosimetry ionizing radiation radiação ionizante aluminium oxide

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