Investigação de ruido e sensibilidade em MAGFETs e avaliação do seu emprego no controle de emissão eletromagnetica em circuitos integrados de potencia / Investigation of noise and sensintivity in MAGFETs and its aplicationin the control of electromagnetic emissions in power integrated circuits

AUTOR(ES)
DATA DE PUBLICAÇÃO

2005

RESUMO

This work deals with the electromagnetic compatibility (EMI) issues aimed to power integrated circuits, typically DC-DC converters. An EMI controlling approach based on magnetic near field measurements using CMOS split-drain transistors (MAGFETS) as magnetic sensors is investigated. Monolithic applications can be envisaged comprising the power circuit and the magnetic sensor. The detected signal can be sent to a slew-rate-based controlling driver that sets the electromagnetic emissions below a specific leveI. However, the electronic noise associated with the split-drain transistor affects the sensor resolution. In this sense, it was observed through correlation measurements an excess noise current associated with the split-drain transistor, called transversal noise current. A noise model taking into account the transversal noise current is proposed, allowing the implementation of magnetic sensors featuring a specific resolution aimed to electromagnetic emissions detectors

ASSUNTO(S)

microeletronica magfet slipt-drain magnetic sensors circuitos integrados noise ruido

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