Fourier-transform analysis of normal photoelectron diffraction data for surface-structure determination
AUTOR(ES)
Hussain, Z.
RESUMO
A direct method for surface-structure determination from normal emission photoelectron diffraction (NPD) data is presented. Fourier transforms of the calculated NPD intensities yield peaks at adsorbate—substrate normal interlayer distances. Applications are demonstrated, using theoretical NPD curves for the Se/Ni system calculated by dynamical theory. These results show that interplanar spacings between the overlayer and as many as four substrate layers can be determined with an accuracy of better than 3%.
ACESSO AO ARTIGO
http://www.pubmedcentral.nih.gov/articlerender.fcgi?artid=348729Documentos Relacionados
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