DOUBLE-SAMPLING CONTROL CHARTS FOR ATTRIBUTES / GRÁFICOS DE CONTROLE POR ATRIBUTOS COM AMOSTRAGEM DUPLA

AUTOR(ES)

AURELIA APARECIDA DE ARAUJO

DATA DE PUBLICAÇÃO

2005

RESUMO

In this thesis, it is proposed the incorporation of the double-sampling strategy, used in lot inspection, to the np control chart (control chart for the number nonconforming), with the purpose of improving its efficiency, that is, reducing the out-of-control average run length (ARL1), without increasing the average sample size (ASS) or the in-control average run length (ARL0). Alternatively, this scheme can be used to reduce the np chart sampling costs, since that in order to get the same ARL1 of the single-sampling np chart, the doublesampling chart will require smaller average sample size. For a number of values of p0 (in-control defective rate of the process) and p1 (out-of-control defective rate of the process), the optimal chart designs were obtained, namely the designs that minimize ARL1, subject to maximum ASS and minimum ARL0 constraints. Optimal designs were obtained for several values of these constraints. The design consists of two sample sizes, for the first and second stages, and a set of limits for the chart. For each optimal design the value of ARL1 was also computed for a range of p1 values besides the one for which the design ARL1 was minimized. A performance comparison was carried out between the proposed scheme and the classical (single-sampling) np chart, the CuSum np scheme, the EWMA np control chart and the VSS np chart (the variable sample size control chart). For comparison, optimal designs for each scheme were considered, under same constraints and values of p0 and p1. An additional contribution of this thesis is the performance analysis and optimization of the np CuSum, EWMA and VSS schemes. The final result is the indication of the most efficient process control scheme for each situation. The double-sampling np control chart here proposed and developed has proved to be in general the most efficient scheme for the detection of large and moderate increases in the process fraction defective, being only surpassed by the VSS chart in the cases in which p0, the (average) sample size and the increase in p0 (p1/p0 ratio) are all small.

ASSUNTO(S)

atributos control charts for attributes statistical process control controle estatistico de processos grafico de np double sampling amostragem dupla np chart attributes graficos de controle para atributos

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