Depth profiling of polymer films with grazing-incidence small-angle X-ray scattering
AUTOR(ES)
Singh, Marsha A.
FONTE
International Union of Crystallography
RESUMO
A procedure for obtaining depth-specific scattering profiles of laterally defined nanostructure using grazing-incidence small-angle X-ray scattering is described.
ACESSO AO ARTIGO
http://www.pubmedcentral.nih.gov/articlerender.fcgi?artid=2724987Documentos Relacionados
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