Caracterização estrutural de cerâmicas ferroelétricas Pb1-xLaxTiO3 e Pb1-xBaxZr0,65Ti0,35O3 por espectroscopia de absorção de raios-x e difração de raios-x / Strutucural charecterization of PB1-xLaxTiO3 e Pb1-xBaxZr0,65Ti0,3503 ferroeletric ceramics by x-ray absoption spectroscopy and x-ray difraction

AUTOR(ES)

Person Pereira Neves

DATA DE PUBLICAÇÃO

2006

RESUMO

In the present work, X-ray diffraction (XRD) and X-ray absorption spectroscopy (XAS) techniques were used in order to investigate, respectively, the long and short range order of Pb1-xLaxTiO3 (PLTX with 0.0 <= x <= 0.30) and Pb1-xBaxZr0,65Ti0,35O3 (PBZTX with 0.0 <= x <= 0.40) ferroelectric ceramic systems. The main objective of this work was to correlate the structural information with the electrical properties presented as a function of the sample composition and the temperature. XAS results shows that for the samples characterized as normal ferroelectric and above or below the phase transition temperature (Tc), the titanium atoms are always displaced from its centre symmetric position on the TiO6 octahedra. The same result was observed for the samples characterized as relaxors below and above the maximum of the relative dielectric permitivitty (Tm). XAS results show than for both systems that the local disorder did not depends if the sample is a relaxor or a normal ferroelectric or if the sample presents a lower or higher symmetric crystalline structure. On the other hand, XRD results show that the normal ferroelectric samples present, respectively, a tetragonal and a cubic structure below and above Tc. On the samples that presents a relaxor behavior (PLT30 and PBZT40), above the temperature of maximum of the relative dielectric permitivitty (Tm), XRD results show a cubic structure for both samples. Below this maximum, for the PBZT40 sample, the structure was also characterized as cubic. However, for the PLT30 sample, XRD results show a phase transition from a cubic (above Tm) to a tetragonal structure (below Tm). A relationship between structural information and the ferroelectric properties are presented. The simultaneous application of DRX and XAS techniques provide interesting and new structural information not yet presented on the specialized literature.

ASSUNTO(S)

estrutura cerâmica ferroelétrica x-ray diffraction difração de raios-x ferroeletric ceramics structure xas xas

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