A high-fault-coverage approach for the test of data, control, and handshake interconnects in mesh networks-on-chip
AUTOR(ES)
Cota, Erika Fernandes
DATA DE PUBLICAÇÃO
2011
RESUMO
A novel strategy for detecting interconnect faults between distinct channels in networks-on-chip is proposed. Short faults between distinct channels in the data, control, and communication handshake wires are considered in a cost-effective test sequence for mesh NoC topologies based on XY routing.
ASSUNTO(S)
fault coverage microeletronica interconnect testing test generation reliability
ACESSO AO ARTIGO
http://hdl.handle.net/10183/27611Documentos Relacionados
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