Medidas do perfil da permissividade eletrica em interfaces solido-liquido, usando microscopia de força atomica

AUTOR(ES)
DATA DE PUBLICAÇÃO

2001

RESUMO

When immersed in water, several surfaces are electrically charged. Therefore, repulsive and attractive forces between the tip and the sample are detected during image generation by atomic force microscopy in aqueous medium. In the last decades repulsive forces have been attributed to electrostatic interactions, while attractive forces have been ascribed to van der Waals forces. In this research, force spectroscopy studies (force versus distance curves) are described between atomic force microscope tips and electrically charged mica immersed in aqueous medium. From the data obtained, a was formulated, model named ?dielectric exchange force? which explains the behavior of the curves in the solid/liquid interface based on the hypothesis that the force acting on the tip in this region arises from the ?dielectric constants? (or dielectric permittivities) exchanges between the tip and the liquid system. In water, when the silicon nitride (Si3N4) tip, with electrical permittivity eTip = 7.4, approaches the charged interface (region named ?electric double layer?, with electric permittivity eDC), it replaces a portion of the water corresponding to its volume. This exchange accounts for the repulsion observed far from the interface (starting at ~100 nm, diffuse layer, where eDC» 80), followed by an attraction when the tip immerses in the inner layers (£ 10 nm). The presence of a charged mica determines dipolar orientation of the water molecules, which in turn is the source of the low electric permittivity in the interface neighborhood. Support for the model proposed was given by immersion of metallic coated tips (eTip » ¥) in water, when a single attractive component was observed, and by immersion of Si3N4tips in formamide and DMSO, where only a repulsive component was detected. The model was further confirmed by the observation that the Si3N4 tips underwent attraction when penetrating the bilayers of a surfactant substance (eS » 2 - 6). When compared to a theory that has been systematically used to explain interactions between surfaces ? DLVO theory ?, the FTD model was more adequate to explain the experimental results. This model was used to identify the magnitude of the force to be applied to fragile samples, in images generation by atomic force microscopy in aqueous medium

ASSUNTO(S)

microscopio e microscopia interfaces (ciencias fisicas)

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